Electron Microscopy The electron microscope uses a focused electron beam energized up to 10 6 eV to provide images and chemical information with very high spatial resolution. Electron Microscopy The electron microscope uses a focused electron beam energized up to 10 6 eV to provide images and chemical information with very high spatial resolution.
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- Zeiss ULTRA-55 FEG SEM
Physical Electronics 5400 ESCA | Physical Electronics 600 AES/SAM |
AES uses an electron beam to excite a sample, and then measures the energies of secondary electrons emitted. Elemental composition information (and some chemical information) is obtained from the top few atomic layers. AES detects all elements except H and He and is most effective on electrically conductive surfaces. Elemental maps can be constructed from the sample to reveal the spatial distribution of elements on the surface. An attached ion gun allows one to obtain elemental depth profiles from the sample.Contact InformationEngineer: Kirk Scammon (407-882-1514, Kirk.Scammon@ucf.edu) |
X-Ray Fluorescence Spectrometer XRF |
XRD #1 Basic Diffraction |
XRD #2 Basic Diffraction |
XRD #3 Basic Diffraction |
Molecular Imaging PicoSPM (STM, AFM) |
Cameca IMS-3F SIMS Ion Microsope | PHI Adept 1010 Dynamic SIMS System |
SIMS (Secondary Ion Mass Spectrometry) is an analytical technique that is used to characterize the surface and near surface (~30mkm) region of materials. It is capable of detecting practically all elements, including hydrogen (only the noble gases are difficult to measure) with detection limits in ppm range for most elements and ppb range for some. There are several modes of SIMS instrument operation:
SIMS can be applied to any type of material (insulators, semiconductors, metals, and organic molecules) that can stay under vacuum. Contact InformationEngineer: Mikhail Klimov (407-882-1509, Mikhail.Klimov@ucf.edu) |
General IONIX 1.7 MU Tandetron RBS (Rutherford Backscattering Spectroscopy)
RBS analysis is performed by bombarding a sample target with a mono energetic beam of high-energy particles, typically helium, with an energy of a few MeV. Some of the incident atoms scatter backwards from heavier atoms in the near surface region of the target material, and are detected with a solid-state detector that measures their energy. The energy of a backscattered particle is related to the depth and mass of the target atom, while the number of backscattered particles detected from any given element is proportional to the concentration. A depth profile of the upper 1-2 μm of the sample is possible. The depth resolution is 2-30 nm. The lateral resolution is 1 mm and the maximum depth is ~2 μm (20 μm with H+). The primary applications of RBS are the quantitative composition depth profiling of thin film structures. RBS is also used to accurately determine the thickness of thin films if the density of the film is known. Detection limits are 1-10 atomic % for low atomic number elements and 0-100 ppm for high atomic number elements. All elements except H and he may be detected. Contact InformationEngineer: Kirk Scammon (407-882-1514, Kirk.Scammon@ucf.edu) |
LEICA EM UC7/FC7 UltramicrotomyThe high quality microtome for precise room temperature and cryo sectioning. The Leica EM UC7 prepares excellent quality semi- and ultra-thin sections, as well as the perfectly smooth surfaces required for LM, TEM, SEM, and AFM examination for biological samples, polymer samples, soft materials and composites. The precision mechanics, ergonomic design, and intuitive layout of the touch screen control unit make the Leica EM UC7 ideal for the highest quality specimen preparation by getting tens nanometers thickness. The Leica EM FC7 provides three different cryo-modes: Standard; High gas flow – increased LN2 gas flow reduces ice contamination below -140°C and Wet sectioning—to set a temperature difference of up to 130°C between knife (-40°C) and specimen (-170°C), which is useful for, e.g., DMSO applications Contact InformationEngineer: TBA |
Zeiss ULTRA-55 FEG SEM (Scanning Electron Microscopy)
The Zeiss Ultra-55 SEM has a unique design to the final lens; it is electrostatic instead of electromagnetic. This feature allows the microscope to image magnetic materials without distortion from created by a magnetic field. This microscope is also capable of delivering very high lateral resolution at low voltages. The Nabity Electron Beam Lithography system allows researchers to create nanometer scale patterns using the pattern generator in conjunction with the electron beam. The Noran System 7 EDS system with Silicon Drift Detector can acquire the EDS spectrum much faster that a conventional SiLi detector and can detect elements as light as Boron. Contact InformationEngineer: Kirk Scammon (407-882-1514, Kirk.Scammon@ucf.edu) |
JEOL JSM-6480 SEM (Scanning Electron Microscopy)
The JEOL JSM-6480 SEM provides a variable pressure mode of operation that allows microscopy of damp, oily and non-conductive samples. It has a unique differential pumping system with a real-time vacuum feedback (RVF) for VP mode. This SEM has automated functions for filament saturation, gun alignment, brightness, contract and stigmatism. |
FEI 200 TEM FIB (Focused Ion Beam Instrument)
The 200 TEM FIB removes material by sputtering using gallium at lateral resolution of approximately 5 nm. Platinum metal can also be deposited by ion beam assisted chemical vapor deposition. Gas assisted etching and selective carbon milling may also be performed. FIB has a wide range of applications:
Micro machining – example: trimming AFM tips or drilling patterns to make optical grating or optical lenses Contact InformationEngineer: TBA |
Olympus LEXT OLS 3000 Confocal Scanning Microscope
The LEXT OLS-3000IR is a near-IR laser based confocal microscope LEXT combines a 408nm laser with optics specifically designed for operation at this wavelength to optimize image quality and limit aberrations. Olympus software provides a simple user interface, fast processing and advanced analysis in a single solution. Brightfield, Darkfield and Differential Interference Contrast (DIC) Microscopy techniques are possible in both video and laser confocal imaging modes. The new confocal laser DIC mode is especially useful for highlighting subtle textural variations during surface analysis. Contact InformationEngineer: Kirk Scammon (407-882-1514, Kirk.Scammon@ucf.edu) |
Renishaw RM 1000B Micro-Raman Spectrometer
Raman spectroscopy is a spectroscopic technique to study vibrational, rotational, and other low-frequency modes. It relies on inelastic scattering, or Raman scattering of monochromatic light, usually from a laser in the visible, near infrared, or near ultraviolet range. The laser light interacts with phonons or other excitations in the system, resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the phonon modes in the system. Raman spectroscopy offers several advantages for microscopic analysis. Since it is a scattering technique, specimens do not need to be fixed or sectioned. Raman spectra can be collected from a very small volume (< 1 μm in diameter); these spectra allow the identification of species present in that volume. Water does not interfere very strongly. Thus, Raman spectroscopy is suitable for the microscopic examination of minerals, materials such as polymers and ceramics, cells and proteins. Contact InformationEngineer: Mikhail Klimov (407-882-1509, Mikhail.Klimov@ucf.edu) |
FEI Tecnai F30 TEM (Transmission Electron Microscope)
The FEI Tecnai F30 is an analytical electron microscope (AEM), which can function as a conventional transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM). It has a field emission gun (FEG) and it can operate up to an accelerating voltage of 300KV. It includes both an energy dispersive x-ray detector (XEDS) and an electron energy loss spectrometer for elemental analysis. The probe size can be reduced to <0.2 nm for chemical analysis and nano-diffraction studies. Contact InformationEngineer: Mikhail Klimov (407-882-1509, Mikhail.Klimov@ucf.edu) |
JEOL TEM-1011(Transmission Electron Microscope)
JEM-1011 is a simple, dependable imaging instrument for high throughput of images with excellent contrast and definition. With an acceleration voltage flexibility of 40 to 100kV, it is suitable for all biological, polymer and thin materials science specimens. Its high contrast objective lens pole piece combines the highest possible contrast and brightness with optimum resolution. The JEOL patented cool beam gun allows high-brightness, high coherence illumination conditions with filament-saving low emission current. JEM-1011 has a unique feature of 2-specimen holder where two specimens are introduced into the column at the same time in the 'Quick Change' holder, facilitating fast imaging throughput and instant comparison under the same operating conditions. Other features include user friendly controls, file storage, and automatic filament heating. Contact InformationEngineer: Mikhail Klimov (407-882-1509, Mikhail.Klimov@ucf.edu) |
Data processing and image simulation facilities
Image and diffraction pattern simulations
- MacTempas / NCEMSS by Roar Kilaas
- (J)EMS by Pierre Stadelmann
- dj_ms, developed at the Centre
Abinitio Quantum mechanical calculations
- WIEN2K by Peter Blaha et al., includes a facility to calculate EELS spectra
- VASP by Georg Kresse and Jürgen Furthmüller
- ABINITfree software project coordinated by X.Gonze
General IONIX 1.7 MU Tandetron RBS (Rutherford Backscattering Spectroscopy)
RBS analysis is performed by bombarding a sample target with a mono energetic beam of high-energy particles, typically helium, with an energy of a few MeV. Some of the incident atoms scatter backwards from heavier atoms in the near surface region of the target material, and are detected with a solid-state detector that measures their energy. The energy of a backscattered particle is related to the depth and mass of the target atom, while the number of backscattered particles detected from any given element is proportional to the concentration. A depth profile of the upper 1-2 μm of the sample is possible. The depth resolution is 2-30 nm. The lateral resolution is 1 mm and the maximum depth is ~2 μm (20 μm with H+). The primary applications of RBS are the quantitative composition depth profiling of thin film structures. RBS is also used to accurately determine the thickness of thin films if the density of the film is known. Detection limits are 1-10 atomic % for low atomic number elements and 0-100 ppm for high atomic number elements. All elements except H and he may be detected. Contact InformationEngineer: Kirk Scammon (407-882-1514, Kirk.Scammon@ucf.edu) |
LEICA EM UC7/FC7 UltramicrotomyThe high quality microtome for precise room temperature and cryo sectioning. The Leica EM UC7 prepares excellent quality semi- and ultra-thin sections, as well as the perfectly smooth surfaces required for LM, TEM, SEM, and AFM examination for biological samples, polymer samples, soft materials and composites. The precision mechanics, ergonomic design, and intuitive layout of the touch screen control unit make the Leica EM UC7 ideal for the highest quality specimen preparation by getting tens nanometers thickness. The Leica EM FC7 provides three different cryo-modes: Standard; High gas flow – increased LN2 gas flow reduces ice contamination below -140°C and Wet sectioning—to set a temperature difference of up to 130°C between knife (-40°C) and specimen (-170°C), which is useful for, e.g., DMSO applications Contact InformationEngineer: TBA |
Zeiss ULTRA-55 FEG SEM (Scanning Electron Microscopy)
The Zeiss Ultra-55 SEM has a unique design to the final lens; it is electrostatic instead of electromagnetic. This feature allows the microscope to image magnetic materials without distortion from created by a magnetic field. This microscope is also capable of delivering very high lateral resolution at low voltages. The Nabity Electron Beam Lithography system allows researchers to create nanometer scale patterns using the pattern generator in conjunction with the electron beam. The Noran System 7 EDS system with Silicon Drift Detector can acquire the EDS spectrum much faster that a conventional SiLi detector and can detect elements as light as Boron. Contact InformationEngineer: Kirk Scammon (407-882-1514, Kirk.Scammon@ucf.edu) |
JEOL JSM-6480 SEM (Scanning Electron Microscopy)
The JEOL JSM-6480 SEM provides a variable pressure mode of operation that allows microscopy of damp, oily and non-conductive samples. It has a unique differential pumping system with a real-time vacuum feedback (RVF) for VP mode. This SEM has automated functions for filament saturation, gun alignment, brightness, contract and stigmatism. |
FEI 200 TEM FIB (Focused Ion Beam Instrument)
The 200 TEM FIB removes material by sputtering using gallium at lateral resolution of approximately 5 nm. Platinum metal can also be deposited by ion beam assisted chemical vapor deposition. Gas assisted etching and selective carbon milling may also be performed. FIB has a wide range of applications:
Micro machining – example: trimming AFM tips or drilling patterns to make optical grating or optical lenses Contact InformationEngineer: TBA |
Olympus LEXT OLS 3000 Confocal Scanning Microscope
The LEXT OLS-3000IR is a near-IR laser based confocal microscope LEXT combines a 408nm laser with optics specifically designed for operation at this wavelength to optimize image quality and limit aberrations. Olympus software provides a simple user interface, fast processing and advanced analysis in a single solution. Brightfield, Darkfield and Differential Interference Contrast (DIC) Microscopy techniques are possible in both video and laser confocal imaging modes. The new confocal laser DIC mode is especially useful for highlighting subtle textural variations during surface analysis. Contact InformationEngineer: Kirk Scammon (407-882-1514, Kirk.Scammon@ucf.edu) |
Renishaw RM 1000B Micro-Raman Spectrometer
Raman spectroscopy is a spectroscopic technique to study vibrational, rotational, and other low-frequency modes. It relies on inelastic scattering, or Raman scattering of monochromatic light, usually from a laser in the visible, near infrared, or near ultraviolet range. The laser light interacts with phonons or other excitations in the system, resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the phonon modes in the system. Raman spectroscopy offers several advantages for microscopic analysis. Since it is a scattering technique, specimens do not need to be fixed or sectioned. Raman spectra can be collected from a very small volume (< 1 μm in diameter); these spectra allow the identification of species present in that volume. Water does not interfere very strongly. Thus, Raman spectroscopy is suitable for the microscopic examination of minerals, materials such as polymers and ceramics, cells and proteins. Contact InformationEngineer: Mikhail Klimov (407-882-1509, Mikhail.Klimov@ucf.edu) |
FEI Tecnai F30 TEM (Transmission Electron Microscope)
The FEI Tecnai F30 is an analytical electron microscope (AEM), which can function as a conventional transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM). It has a field emission gun (FEG) and it can operate up to an accelerating voltage of 300KV. It includes both an energy dispersive x-ray detector (XEDS) and an electron energy loss spectrometer for elemental analysis. The probe size can be reduced to <0.2 nm for chemical analysis and nano-diffraction studies. Contact InformationEngineer: Mikhail Klimov (407-882-1509, Mikhail.Klimov@ucf.edu) |
JEOL TEM-1011(Transmission Electron Microscope)
JEM-1011 is a simple, dependable imaging instrument for high throughput of images with excellent contrast and definition. With an acceleration voltage flexibility of 40 to 100kV, it is suitable for all biological, polymer and thin materials science specimens. Its high contrast objective lens pole piece combines the highest possible contrast and brightness with optimum resolution. The JEOL patented cool beam gun allows high-brightness, high coherence illumination conditions with filament-saving low emission current. JEM-1011 has a unique feature of 2-specimen holder where two specimens are introduced into the column at the same time in the 'Quick Change' holder, facilitating fast imaging throughput and instant comparison under the same operating conditions. Other features include user friendly controls, file storage, and automatic filament heating. Contact InformationEngineer: Mikhail Klimov (407-882-1509, Mikhail.Klimov@ucf.edu) |
Data processing and image simulation facilities
Image and diffraction pattern simulations
- MacTempas / NCEMSS by Roar Kilaas
- (J)EMS by Pierre Stadelmann
- dj_ms, developed at the Centre
Abinitio Quantum mechanical calculations
- WIEN2K by Peter Blaha et al., includes a facility to calculate EELS spectra
- VASP by Georg Kresse and Jürgen Furthmüller
- ABINITfree software project coordinated by X.Gonze
Image processing techniques
Masstemps Aquent
- TrueImage, enhances the resolution of images by the method of through focus exitwave reconstruction. This is a commercial software made by FEI. Information on obtaining the software should be requested from FEI.
Quantitative Data Analysis
- ELSTRU developed in Delft to analyse electron diffraction data, includes the famous MSLS program
Mactemps Download
All this software runs on a variety of computing systems.